Lam Research VME-LTNI-S4 B105-0102 Network Interface Board – VME Series
Lam Research VME-LTNI-S4 B105-0102 Network Interface Board: Supply Continuity Strategy for Semiconductor Fab Procurement Teams The Lam Research VME-LTNI-S4 B105-0102…
Model: 810-234640-311
Product Overview
Commercial availability is handled through direct RFQ, model verification and export-oriented follow-up rather than public cart checkout.
Datasheet Preview
Use attached product manuals when available. If the manual is not public yet, request the full file directly through RFQ.
Commercial Path
Product pages on DRIVEKNMS are designed to verify model, brand and series first, then move the buyer into one clean quotation path.
Technical Dossier
The LAM Research 810 Series represents a core hardware platform deployed across semiconductor fabrication equipment, including plasma etch and chemical vapor deposition (CVD) systems. These modules are embedded in capital equipment operating in environments with strict uptime requirements — including semiconductor fabs, flat panel display manufacturing lines, and advanced materials processing facilities. The 810 Series power supply and control modules are integral to LAM Research systems such as the Rainbow, Transformer Coupled Toroidal (TCP), and Versys platforms, which are installed in volume at Tier 1 fabs globally. Due to the long operational lifecycle of semiconductor capital equipment (often 10–20 years), the 810 Series remains in active demand for maintenance, repair, and overhaul (MRO) procurement well beyond its original production window.
The LAM Research 810 Series was developed as a modular subsystem architecture to support the increasing complexity of RF power delivery, DC bias control, and process gas management in plasma processing equipment. Early-generation 810 modules used discrete analog control circuits with limited diagnostic capability. Subsequent revisions introduced embedded microcontrollers, digital communication buses (RS-422, RS-485), and improved thermal management via conduction-cooled backplane designs. Later variants incorporated FPGA-based signal processing for real-time impedance matching feedback. Compatibility between hardware revisions is not guaranteed across all sub-series; field engineers must verify PCB revision levels and firmware versions before substitution. As LAM Research transitioned to next-generation platforms (Kiyo, Flex, Syndion), the 810 Series entered a mature/end-of-life phase. OEM new production has ceased for the majority of 810 Series part numbers. Installed base support now relies on refurbished, tested-used, and new-surplus inventory sourced through specialist distributors.
The following part numbers represent verified, commonly traded SKUs within the LAM Research 810 Series. Each entry reflects a distinct functional module within the platform architecture.
Power Supply Modules
RF & Process Control Modules
I/O & Communication Modules
The majority of LAM Research 810 Series part numbers have been discontinued by the OEM. DriveKNMS maintains a dedicated inventory program for end-of-life semiconductor equipment modules, with specific coverage of the 810 Series. Sourcing channels include decommissioned fab equipment, controlled factory surplus, and tested-used modules recovered from system upgrades. All 810 Series inventory at DriveKNMS is cataloged by part number, PCB revision, and functional test status. For customers operating legacy LAM Research systems beyond OEM support windows, DriveKNMS provides long-term availability commitments, cross-reference matching for superseded part numbers, and consignment evaluation for customer-owned surplus. Procurement teams requiring bill-of-materials (BOM) fulfillment for scheduled maintenance shutdowns are encouraged to submit complete parts lists for consolidated quotation.
The LAM Research 810 Series employs a multi-layer backplane bus architecture with mixed analog and digital signal routing. Standard incoming inspection procedures at DriveKNMS include visual inspection for component damage, corrosion, and PCB delamination; in-circuit testing (ICT) of passive and active components against reference schematics; functional power-on testing under controlled load conditions with calibrated bench power supplies; and communication bus verification using protocol analyzers for RS-422/RS-485 and digital I/O modules. Power supply modules including the 810-234640-311 are subjected to full-load burn-in testing at rated output current for a minimum of 4 hours, with output voltage, ripple, and thermal performance logged against OEM specifications. Modules that fail any test parameter are quarantined, documented, and either repaired to specification or scrapped. No module is shipped without a traceable test record.
© 2026 DriveKNMS. All trademarks belong to their respective owners. Specifications are for reference only and subject to change without notice. Verify all parameters against official documentation before installation.