Emerson DeltaV CHARM Modules: 12P4629X042 Analog Output 4-20mA HART & Full Series

Technical Dossier

Product Details And Specifications

Emerson DeltaV CHARM Series Technical Notes

The Emerson DeltaV CHARM (Characterization Module) I/O system is a field-proven, channel-based I/O architecture deployed across the global process industries, including petroleum refining, LNG terminals, nuclear power generation, chemical manufacturing, and offshore platforms. Unlike traditional card-based I/O, each CHARM is a single-channel, individually addressable module that plugs into a CHARM I/O Card (CIOC) baseplate, enabling per-channel signal type configuration without hardware redesign. This architecture has made the DeltaV CHARM system the preferred I/O solution for greenfield and brownfield DCS projects requiring maximum flexibility, high channel density, and intrinsic safety compliance (ATEX, IECEx, FM).

The 12P4629X042 is an Analog Output CHARM rated for 4–20mA HART signals, used to drive control valves, variable speed drives, and other final control elements requiring a standard current loop with HART digital overlay. It is a core component in DeltaV S-series and M-series controller architectures.

The Evolution of DeltaV CHARM Architecture

Emerson introduced the DeltaV CHARM I/O platform as part of the DeltaV Version 12 release cycle, replacing the legacy 2/4-wire card-based I/O with a channel-oriented paradigm. Early CHARM generations (v12.x) established the baseline CIOC infrastructure and supported AI, AO, DI, and DO signal types. Version 13.x expanded the catalog to include HART-enabled variants and intrinsically safe (IS) CHARMs certified for Zone 0/1 hazardous areas. Version 14.x introduced SIS (Safety Instrumented System) CHARMs compliant with IEC 61511, enabling integration with the DeltaV SIS platform on a shared physical infrastructure. The current generation (v15.x and later) supports Electronic Marshalling with full redundancy options, FOUNDATION Fieldbus CHARMs, and enhanced diagnostics via AMS Device Manager. Legacy CHARMs from v12.x remain physically compatible with current CIOC baseplates but may require firmware alignment for full feature support. This backward compatibility is a critical factor for long-term maintenance planning at sites running mixed DeltaV versions.

DeltaV CHARM Full Catalog & Functionalities (SKU List)

Analog Input (AI) CHARMs

• 12P4627X012: AI CHARM, 4–20mA HART, non-IS, standard process measurement input
• 12P4627X022: AI CHARM, 4–20mA HART, IS (intrinsically safe), Zone 1 certified
• 12P4627X032: AI CHARM, 1–5V DC input, non-IS, voltage signal measurement
• 12P4627X052: AI CHARM, RTD (Pt100/Pt1000), 2/3/4-wire, temperature measurement
• 12P4627X062: AI CHARM, Thermocouple (TC), multi-type, cold junction compensated
• 12P4627X072: AI CHARM, 4–20mA HART, IS, SIL 2 rated for safety loops

Analog Output (AO) CHARMs

• 12P4629X042: AO CHARM, 4–20mA HART, non-IS, standard control output for final elements
• 12P4629X052: AO CHARM, 4–20mA HART, IS, intrinsically safe control output
• 12P4629X062: AO CHARM, 4–20mA HART, IS, SIL 2 rated for safety output loops

Discrete Input (DI) CHARMs

• 12P4628X012: DI CHARM, 24VDC, non-IS, standard digital status input
• 12P4628X022: DI CHARM, 24VDC, IS, intrinsically safe digital input
• 12P4628X032: DI CHARM, 120VAC, non-IS, high-voltage discrete input
• 12P4628X042: DI CHARM, 24VDC NAMUR, IS, proximity switch / solenoid feedback input

Discrete Output (DO) CHARMs

• 12P4630X012: DO CHARM, 24VDC, non-IS, standard digital control output
• 12P4630X022: DO CHARM, 24VDC, IS, intrinsically safe digital output
• 12P4630X032: DO CHARM, 120VAC, non-IS, high-voltage discrete output

CHARM I/O Card (CIOC) & Infrastructure

• 12P2178X012: CHARM I/O Card (CIOC), 96-channel baseplate controller, Ethernet redundancy
• 12P2178X022: CIOC, redundant pair configuration, hot-standby failover

Quality Control for the DeltaV CHARM Range

Each CHARM module processed by DriveKNMS undergoes a structured verification protocol specific to the CHARM backplane bus architecture. Testing includes: HART communication loop verification (primary variable, device descriptor, and command set validation), 4–20mA output linearity check across the full span (0–110% of range), IS barrier integrity test for intrinsically safe variants, CIOC slot insertion/extraction cycle test to verify connector integrity, and firmware version identification against Emerson's compatibility matrix. Modules exhibiting marginal HART response times or non-linear output curves are rejected. Only units passing full functional verification are released for sale, with test records available on request.