YOKOGAWA F3LD01-ON DeviceNet Scanner Module

Technical Dossier

Product Details And Specifications

YOKOGAWA F3LD Series Technical Notes

The YOKOGAWA F3LD series represents the DeviceNet communication layer within the FA-M3 Range-free Multi-controller platform — one of the most widely deployed distributed control architectures in global heavy industry. FA-M3 controllers equipped with F3LD DeviceNet scanner modules are installed across petrochemical complexes, LNG terminals, nuclear auxiliary systems, and continuous-process refineries throughout Asia, the Middle East, and Europe. The F3LD01-ON specifically functions as a DeviceNet master scanner, enabling the FA-M3 CPU to poll and command up to 63 slave nodes across a single DeviceNet trunk, making it a critical fieldbus interface in legacy and active DCS/PLC hybrid architectures.

The Evolution of F3LD Architecture

The FA-M3 platform was introduced in the mid-1990s as YOKOGAWA's modular rack-based industrial controller. The F3LD DeviceNet scanner modules were developed to bridge the FA-M3 backplane bus with the IEC 62026-3 / EN 50325-2 compliant DeviceNet fieldbus standard, which gained widespread adoption in discrete manufacturing and process automation during the late 1990s and 2000s.

Early F3LD variants operated at fixed baud rates and supported limited EDS-based device configuration. Subsequent revisions introduced auto-baud detection, expanded I/O mapping tables, and improved diagnostic messaging via explicit messaging channels. The F3LD01-ON carries the "-ON" suffix denoting its DeviceNet master (scanner) role, distinguishing it from adapter-mode or slave-only configurations.

As DeviceNet has entered a mature and declining lifecycle relative to EtherNet/IP and PROFINET, the F3LD series is now primarily relevant in the context of long-term maintenance, lifecycle extension, and spare parts management for installed FA-M3 systems. YOKOGAWA has not announced a direct like-for-like replacement within the FA-M3 form factor; migration paths typically involve FA-M3R or STARDOM FCN/FCJ platforms with EtherNet/IP communication modules.

F3LD Full Catalog & Functionalities (SKU List)

The following SKUs represent verified modules within the YOKOGAWA FA-M3 F3LD and related communication and I/O module range, classified by functional role.

DeviceNet Scanner / Communication Modules

• F3LD01-ON: DeviceNet master scanner module, 63-node capacity, FA-M3 backplane mount
• F3LD02-ON: DeviceNet scanner module, extended I/O mapping, enhanced diagnostic support
• F3LD11-ON: DeviceNet slave adapter module for FA-M3 sub-rack integration

CPU / Controller Modules

• F3SP22-0S: FA-M3 sequence CPU, 30K step program capacity, standard I/O scan
• F3SP28-3N: FA-M3 sequence CPU, 60K step, high-speed interrupt processing
• F3SP35-5N: FA-M3 sequence CPU, 120K step, multi-task execution
• F3SP38-6N: FA-M3 sequence CPU, 250K step, large-scale application support
• F3SP53-4H: FA-M3 sequence CPU with built-in Ethernet port, 120K step
• F3SP58-6H: FA-M3 sequence CPU, 500K step, Ethernet-equipped
• F3SP66-4S: FA-M3 sequence CPU, motion-capable, high-speed axis control
• F3SP76-7N: FA-M3 sequence CPU, 1M step, advanced multi-task architecture

Digital I/O Modules

• F3DI32-0N: 32-point DC digital input module, 24 VDC, sink/source compatible
• F3DO32-0N: 32-point DC digital output module, 24 VDC transistor output
• F3DI16-0N: 16-point DC digital input module, isolated, 24 VDC
• F3DO16-0N: 16-point DC digital output module, relay contact output

Analog I/O Modules

• F3AD04-0N: 4-channel analog input, 4-20 mA / 0-10 V, 12-bit resolution
• F3AD08-0N: 8-channel analog input module, high-resolution 16-bit
• F3DA04-0N: 4-channel analog output module, 4-20 mA / 0-10 V selectable

Power Supply Modules

• F3PU20-0S: FA-M3 base unit power supply, 100-240 VAC input, 5 VDC / 4 A output
• F3PU30-0S: FA-M3 power supply, high-capacity, 5 VDC / 6 A output

Quality Control for the F3LD Range

FA-M3 backplane communication modules such as the F3LD01-ON require functional validation beyond basic power-on testing. DriveKNMS applies a structured test protocol for all F3LD series units:

• Backplane bus continuity and slot impedance verification using FA-M3 base unit test fixtures
• DeviceNet physical layer testing: CAN bus termination resistance (60 Ohm nominal), signal integrity at 125 / 250 / 500 kbps baud rates
• Master scanner functional test: node allocation and I/O polling cycle verification against reference slave devices
• Explicit messaging channel test: read/write transactions to simulated DeviceNet slave EDS configurations
• Thermal cycling and burn-in: 48-hour operation at 50 degrees C ambient to screen latent component failures
• Firmware version identification and documentation prior to shipment