Emerson CHARM Series Modules: 12P4628X102 Terminal Block,

Technical Dossier

Product Details And Specifications

Emerson CHARM Series Technical Notes

The Evolution of CHARM Architecture

The CHARM platform was introduced alongside the DeltaV Electronic Marshalling concept, first commercialized in the early 2010s as a response to the engineering cost and inflexibility of conventional hardwired marshalling. The architecture centers on the CIOC (CHARM I/O Card), which hosts up to 12 individual CHARM modules on a single carrier. Early CHARM generations supported standard signal types: 4–20 mA HART, discrete 24 VDC, and thermocouple inputs. Subsequent revisions expanded the catalog to include high-density variants, intrinsically safe (IS) CHARMs for Zone 0/1 hazardous areas, and SIS-rated (Safety Instrumented System) CHARMs compliant with IEC 61511 for use in DeltaV SIS architectures. The terminal block — including the 12P4628X102 — serves as the physical field-wiring interface, providing the mechanical and electrical termination point between field cables and the CHARM module body. Terminal blocks are revision-tracked components; compatibility must be verified against the specific CHARM module generation and CIOC firmware revision. As the DeltaV platform has matured, older CIOC revisions have entered limited support status, increasing demand for verified spare terminal block assemblies.

CHARM Full Catalog & Functionalities (SKU List)

The following SKUs represent verified, commonly stocked components within the Emerson CHARM ecosystem, organized by functional category:

Terminal Blocks & Carrier Hardware

12P4628X102: CHARM terminal block assembly, field-wiring termination for standard CHARM modules
12P4628X012: CHARM terminal block, alternate revision, single-channel field termination
12P4628X022: CHARM terminal block assembly, revision 2, compatible with IS CHARM carriers
KJ3221X1-BA1: CHARM I/O Card (CIOC), 12-slot CHARM carrier card, DeltaV S-series
KJ3221X1-BB1: CHARM I/O Card (CIOC), revision BB1, enhanced diagnostics firmware

Analog Input (AI) CHARMs — 4–20 mA HART

KJ3002X1-BA1: AI CHARM, 4–20 mA HART, single-channel, standard area
KJ3002X1-BB1: AI CHARM, 4–20 mA HART, revision BB1, extended diagnostics
KJ3012X1-BA1: AI CHARM, 4–20 mA HART, intrinsically safe (IS), Zone 0/1
KJ3012X1-BB1: AI IS CHARM, revision BB1, IECEx/ATEX certified

Analog Output (AO) CHARMs — 4–20 mA HART

KJ3222X1-BA1: AO CHARM, 4–20 mA HART, single-channel, standard area
KJ3222X1-BB1: AO CHARM, 4–20 mA HART, revision BB1
KJ3232X1-BA1: AO CHARM, 4–20 mA HART, intrinsically safe (IS)

Discrete Input (DI) CHARMs

KJ3102X1-BA1: DI CHARM, 24 VDC, single-channel, standard area
KJ3112X1-BA1: DI CHARM, 24 VDC, intrinsically safe (IS), Zone 0/1

Discrete Output (DO) CHARMs

KJ3302X1-BA1: DO CHARM, 24 VDC, single-channel, standard area
KJ3312X1-BA1: DO CHARM, 24 VDC, intrinsically safe (IS)

Thermocouple / RTD Input CHARMs

KJ3402X1-BA1: TC/RTD CHARM, thermocouple and RTD input, single-channel
KJ3412X1-BA1: TC/RTD CHARM, intrinsically safe (IS) variant

SIS-Rated CHARMs (DeltaV SIS)

KJ3002X1-BC1: AI SIS CHARM, 4–20 mA HART, SIL 2 rated, IEC 61511 compliant
KJ3102X1-BC1: DI SIS CHARM, 24 VDC, SIL 2 rated

Quality Control for the CHARM Range

CHARM modules and terminal block assemblies undergo a structured inspection and functional test protocol prior to shipment. Terminal blocks are inspected for contact integrity, screw torque retention, and mechanical fit against reference CIOC carrier hardware. CHARM module bodies are tested for signal characterization accuracy across the rated input/output range using calibrated signal sources and loads. For HART-enabled CHARMs, HART communication is verified at 1200 baud using a HART master device. IS-rated CHARMs are inspected for barrier integrity and certification label legibility. All tested units are logged with serial number, test date, and pass/fail criteria. Units that do not meet specification are quarantined and not offered for sale.