Yokogawa SDV144-S13 S2

Model: SDV144-S13 S2

Brand Yokogawa
Series SDV144-S13 S2
Model SDV144-S13 S2
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Technical Dossier

Product Details And Specifications

Yokogawa SDV Series Technical Notes

The Yokogawa SDV Series represents a core family of digital I/O interface modules deployed within the Yokogawa CENTUM CS 3000 and CENTUM VP Distributed Control Systems (DCS). These modules serve as the primary signal interface layer between field instrumentation and the DCS controller bus, and have accumulated decades of installed base across global heavy industries including petrochemical complexes, nuclear power facilities, crude oil refineries, LNG terminals, and continuous process manufacturing plants.

The SDV Series is engineered to Yokogawa's Vnet/IP and ESB (Enhanced Signal Bus) communication standards, ensuring deterministic scan cycle performance and high-integrity signal conditioning. Modules in this family are characterized by their plug-in node card architecture, which allows hot-swap replacement without process interruption in redundant configurations. The global installed base of CENTUM CS 3000 and CENTUM VP systems — estimated in the tens of thousands of units across more than 100 countries — makes the SDV Series one of the most strategically significant spare parts families in industrial automation.

The Evolution of SDV Series Architecture

The SDV module family traces its lineage to Yokogawa's CENTUM CS platform introduced in the mid-1990s. The original CS-series I/O architecture used parallel backplane communication with fixed-slot addressing. With the transition to CENTUM CS 3000 (released circa 1998), Yokogawa introduced the Node Unit (NU) architecture, where SDV-prefix modules became the standardized digital I/O node cards operating over the ESB bus at 10 Mbps.

The subsequent CENTUM VP platform (introduced 2008) retained full backward compatibility with CS 3000 SDV modules at the hardware level, allowing existing field wiring and node cards to be reused during controller upgrades. This architectural continuity is a defining characteristic of the SDV family and a primary reason for its longevity in the field. Later revisions introduced suffix designators (S1, S2, S3, S13) indicating hardware revision levels, firmware compatibility bands, and CE/ATEX certification variants. The S2 suffix on the SDV144-S13 S2 denotes a second-generation hardware revision with enhanced EMC compliance and updated ASIC firmware.

As of 2026, the CENTUM CS 3000 platform has entered its end-of-active-support phase, while CENTUM VP remains in active production. SDV modules compatible with CS 3000 are increasingly sourced through the secondary market, making verified spare parts inventory a critical operational requirement for plant maintenance teams.

SDV Series Full Catalog & Functionalities (SKU List)

The following SKUs represent verified models within the Yokogawa SDV Series, classified by functional category. Each model is a discrete node card designed for installation in the CENTUM CS 3000 or CENTUM VP Node Unit chassis.

Digital Input (DI) Modules

  • SDV144-S13 S2: 32-channel 24VDC digital input module, S2 hardware revision, ESB bus interface, CE compliant
  • SDV144-S13 S1: 32-channel 24VDC digital input module, S1 hardware revision, first-generation ASIC, CS 3000 native
  • SDV141: 16-channel 24VDC digital input, standard density, non-isolated, ESB interface
  • SDV142: 16-channel 100/120VAC digital input module, high-voltage field signal compatible
  • SDV143: 16-channel 200/240VAC digital input module, industrial AC signal conditioning
  • SDV144: 32-channel 24VDC digital input, high-density configuration, dual-port ESB
  • SDV146: 16-channel dry contact digital input, isolated, for potential-free field contacts

Digital Output (DO) Modules

  • SDV541: 16-channel 24VDC digital output, transistor type, 0.5A per channel, ESB bus
  • SDV542: 16-channel relay output module, Form-A contacts, 2A/channel, 250VAC rated
  • SDV543: 16-channel 24VDC digital output, high-current 1A per channel, short-circuit protected
  • SDV544: 32-channel 24VDC digital output, high-density transistor output, dual ESB port
  • SDV546: 8-channel relay output, Form-C contacts, for critical interlock and shutdown circuits

Analog Input (AI) Modules

  • SAI143: 8-channel 4–20mA analog input, 16-bit resolution, HART pass-through capable
  • SAI533: 8-channel thermocouple/mV input, multi-type sensor support, cold junction compensation
  • SAI143-H: 8-channel HART-enabled analog input, supports FDT/DTM field device integration

Analog Output (AO) Modules

  • SAO143: 8-channel 4–20mA analog output, 16-bit DAC, loop-powered field device compatible
  • SAO143-H: 8-channel HART analog output, supports valve positioner diagnostics via HART protocol

Communication & Power

  • SCP451: Node Unit communication processor, ESB master controller, manages up to 8 node cards
  • SNT100: Node Unit power supply module, 24VDC input, redundant power bus output

Quality Control for the SDV Series Range

SDV Series modules incorporate a multi-layer backplane communication architecture that requires functional validation beyond simple power-on testing. DriveKNMS applies the following test protocol to all SDV Series units prior to shipment:

  • ESB Bus Communication Test: Each module is installed in a live CENTUM CS 3000 or CENTUM VP test bench and polled via the SCP451 communication processor to verify node address registration and cyclic data exchange at rated scan speed.
  • Channel-Level I/O Verification: For DI modules (including SDV144-S13 S2), all 32 input channels are individually stimulated with calibrated 24VDC signals and verified for correct state reporting in the DCS engineering station.
  • Isolation Resistance Test: Field terminal blocks are tested for channel-to-channel and channel-to-ground isolation resistance per IEC 61010 requirements.
  • Firmware Revision Audit: ASIC firmware version is read and documented. Modules with firmware incompatible with target platform revision are flagged and segregated.
  • Thermal Burn-In: Units are operated at 45°C ambient for a minimum of 8 hours to screen for latent component failures prior to packaging.

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